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The electrification of automobiles is advancing toward autonomous driving, and accordingly noise countermeasures in automobiles become increasingly important. This time, we will introduce an automotive noise suppression filter MHF/MDF series that has unique features as compared to general chip beads.
The MHF series achieves a high impedance in the MF and HF bands ranging from 300 kHz to 30 MHz used in radios, etc., and has an excellent noise suppression effect. Furthermore, the MDF series is a product with excellent DC bias characteristics of impedance so that an excellent noise suppression effect can be obtained even when used in a power supply line.
As the safety and convenience of automobiles increases, more electronic devices are being used in vehicles. Electronic circuits have signal lines and power supply lines, and both require noise countermeasures. Here, we present examples of countermeasures based on data measured using a TDK power supply line Common Mode Filters / Chokes.
Introducing the features and functions of TDK chip beads and the points of selection.
We present methods of use and effects of the MAF series of EMI suppression filters and AVRF series of ESD Notch Filters, both ideal for audio lines.
PTM (Product Training Module) Basics of EMC measures（bypass）
PTM (Product Training Module) Basics of EMC measures (introduction)
PTM (Product Training Module) Basics of EMC measures (shield)
PTM (Product Training Module) Basics of EMC measures (absorption)
PTM (Product Training Module) Basics of EMC measures (reflection)
PTM (Product Training Module) TDK Wireless Charge Coil Single Pattern Solution
In conjunction with the increased use of GaN semiconductor, which can operate a high frequency, higher frequencies for switching power supplies have become feasible. Ferrite materials are used in transformer products, but core loss (iron loss) varies greatly depending on the driving frequency, and they are key components in transformer design. This article presents information on the features of PC200 material, which was developed by using GaN, and key points concerning its use.
The definition of FIT is the total number of failures in a population divided by the total number of time units spent by the population over a certain measured period under certain conditions. FIT is generally expressed by λ (lambda). The scale of FIT is inverse to the time, and 1 FIT is equal to 10⁹/time. In other words, 1 FIT is one failure per 1,000,000,000 hours.
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