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Examples of Countermeasures Using a Power Supply Line Common Mode Filters / Chokes

As the safety and convenience of automobiles increases, more electronic devices are being used in vehicles. Electronic circuits have signal lines and power supply lines, and both require noise countermeasures. Here, we present examples of countermeasures based on data measured using a TDK power supply line Common Mode Filters / Chokes.

PTM (Product Training Module) Chip Beads

Introducing the features and functions of TDK chip beads and the points of selection.

PTM (Product Training Module) Audio Solution Edition

We present methods of use and effects of the MAF series of EMI suppression filters and AVRF series of ESD Notch Filters, both ideal for audio lines.

PTM (Product Training Module) Basics of EMC measures（bypass）

PTM (Product Training Module) Basics of EMC measures（bypass）

PTM (Product Training Module) Basics of EMC measures (introduction)

PTM (Product Training Module) Basics of EMC measures (introduction)

PTM (Product Training Module) Basics of EMC measures (shield)

PTM (Product Training Module) Basics of EMC measures (shield)

PTM (Product Training Module) Basics of EMC measures (absorption)

PTM (Product Training Module) Basics of EMC measures (absorption)

PTM (Product Training Module) Basics of EMC measures (reflection)

PTM (Product Training Module) Basics of EMC measures (reflection)

PTM (Product Training Module) TDK Wireless-Ladespule Einzelmusterlösung

PTM (Product Training Module) TDK Wireless-Ladespule Einzelmusterlösung

PTM (Product Training Module) Magnetblech für RFID/Basic

PTM (Product Training Module) Magnetblech für RFID/Basic

High-Frequency, Low-Loss Ferrite Material PC200

In conjunction with the increased use of GaN semiconductor, which can operate a high frequency, higher frequencies for switching power supplies have become feasible. Ferrite materials are used in transformer products, but core loss (iron loss) varies greatly depending on the driving frequency, and they are key components in transformer design. This article presents information on the features of PC200 material, which was developed by using GaN, and key points concerning its use.

FIT (Failure In Time)

The definition of FIT is the total number of failures in a population divided by the total number of time units spent by the population over a certain measured period under certain conditions. FIT is generally expressed by λ (lambda). The scale of FIT is inverse to the time, and 1 FIT is equal to 10⁹/time. In other words, 1 FIT is one failure per 1,000,000,000 hours.