SMART (Self-Monitoring & Analysis Reporting Technology [SMART information]) software performs self-diagnostic functions.
The NAND Flash memory built into compact flash (CF) cards, SSD (solid state drives) and SD cards can only perform a certain number of program (erase) operations due to its limited endurance.
When using built-in CF cards, SSD or SD cards, it is especially important to monitor program (erase) counts, track how much defective blocks have generated as devices near the end of their lifespan, and get quantitative, real-time assessments of CF card, SSD, and SD card endurance in actual systems.
The TDK SMART program provides the following information.
If you agree to the above licensing policy, click the "Agree" button to download the software.
|CF cards: CFE9D Series||SMART_GBD（ZIP: 200KB）*
|CFastTM: CAE3B Series|
|CFastTM: CAE1B Series|
|PATA SSD: SDE9D Series|
|SATA SSD: SDE1B Series|
|mSATA: SME3B Series|
|mSATA: SME1B Series|
|Half Slim type SSD: SHE1B Series|
|M.2: SNE1B Series|
|SD/microSD memory card: MMRD4/MURD4 Series|