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- Multilayer Ceramic Chip Capacitors
A. TDK uses the Arrhenius model (revised by Prokopowicz and Vaskas) to describe failure caused by systematic degradation. This model assumes that the degradation of the dielectric of the capacitor depends both on the temperature and the applied voltage. Basically these are stress factors placed on the system and are collectively called Acceleration Factors. Acceleration Factors are calculated as Voltage Acceleration (AV) times the Temperature Acceleration (AT). The resulting Acceleration Factor will be used in calculating the final FIT number.
Voltage Acceleration is one of the two Acceleration Factors used to calculate FIT and MTBF. TDK uses the equation below to calculate this factor.
- V = Test Voltage
- V0 = Operating Voltage
- α = Voltage Acceleration Coefficient
- T = Test Temperature in °C
- T0 = Operating Temperature in °C